Elettra
BL 03.2R - BaDElPh@VUV
Band Dispersion and Vacuum UltraViolet Photoemission
BaDElPh@VUV, a temporary joint project of ISM-CNR and Elettra - Sincrotrone Trieste, provides the state-of-the-art instrumentation of the new BaDElPh end station connected to the VUV-Photoemission beamline for the next period. Since 2025, it has been operating through the joint efforts of the research groups of the former BaDElPh and VUV-Photoemission beamlines.
The horizontal linear polarized synchrotron radiation in the energy range 20(25)-750 eV is primarily used to perform photoemission investigations of solid surfaces and nanostructured materials. In particular, angle-resolved photoemission spectroscopy (ARPES with the MBS A-1 analyzer) with also spin-resolved mode (by MBS spin manipulator and FOCUS FERRUM spin detector, under commissioning), UPS, XPS and PED.
BaDElPh@VUV operates in time sharing with the Spectromicroscopy beamline, with 50% of time.
Beamline Energy Resolution
8 [meV] @ 65 [eV]
Beamline Energy Range
20 - 750 [eV]
Max Flux On Sample
1 * 1013 [ph/s] @ 100 [eV]
Spot Size On Sample Hor
300 - 500 [um]
Spot Size On Sample Vert
100 - 200 [um]
Angle Of Incidence Light On Sample Value
20 - 110 [degrees]
Photon Sources
U12.5 undulator
Type
Undulator
Available Polarization
Linear horizontal
Variable Polarization
Yes
Source Divergence Sigma
X = 0.07 [urad], Y = 0.074 [urad]
Energy Range
17 - 900 [eV]
Number Of Periods
36
Monochromators
Spherical Grating Monochromator
Energy Range
17 - 1000 [eV]
Type
Spherical Grating Monochromator with five interchangeable gratings and pre- and post-focusing optics
Resolving Power
20 * 103 [deltaE/E] @ 65 [eV]
Number Of Gratings
5
Grating Type
spherical
Endstations or Setup
End station
Diffractometer
OCI low enery electron diffraction (LEED) optics
Spectrometer
MBS A-1 hemispherical electron analyzer with a fast 2D-CMOS detector
Base Pressure
2 * 10-11 [mbar]
Detectors Available
Fast 2D-CMOS imaging detector
3D-VLEED Spin detector
3D-VLEED Spin detector
Endstation Operative
Yes
Sample
Sample Type
Crystal
Other Sample Type
Policrystal, thin film, powder
Mounting Type
Fixed on home-made sample flag
Required Sample Size
X = 10 [mm], Y = 10 [mm], Z = 8 [mm]
X = 1 [mm], Y = 1 [mm], Z = 0.1 [mm]
X = 1 [mm], Y = 1 [mm], Z = 0.1 [mm]
Manipulator or Sample stage
Description
The sample manipulator has five degree of freedom (xyz translations, polar and azimuthal rotational axes). It is based on a open-cycle helium cryostat (ARS LT-3M), is fully motorized (by stepper motors for the polar rotation and xyz translations and by the piezo motor for the azimuthal rotation), and it can be remotely controlled.
The temperature can be measured by a calibrated C-type thermocouple and by a standard silicon diode (DT-470) installed next to the sample and on the cold finger, respectively. The head of the cryostat includes also a cartridge heater allowing a remote control of the temperature in the range 5-400 K.
The temperature can be measured by a calibrated C-type thermocouple and by a standard silicon diode (DT-470) installed next to the sample and on the cold finger, respectively. The head of the cryostat includes also a cartridge heater allowing a remote control of the temperature in the range 5-400 K.
Degrees Of Freedom
5
Translator Stages
3
Cradles
2
Positioning Precision
X = 5 [um], Y = 5 [um], Z = 5 [um]
Range Of Movement
X = 50 [mm], Y = 50 [mm], Z = 600 [mm]
Sample Environment
Description
The Experimental or Analysis chamber is in mu-metal and houses a 4th-generation high-resolution (1 meV / 0.1°) and -transmission (200 mm mean radius) hemispherical electron energy analyzer MBS A-1 with lens scanning and wide acceptance angle, a fast 2D-CCD detector for ARPES, and the MBS Spin Manipulator and a VLEED (FOCUS Ferrum) detector for Spin-ARPES (under commissioning), a high-intensity VUV source (He, Omicron HIS 13, temporarily unavailable), a conventional X-ray source (Al & Mg, PSP TX400, temporarily unavailable), a low-energy electron diffraction (LEED) optics (OCI), a home-made gas-cell (temporarily unavailable), and a residual gas analyzer (SRS RGA200). It is connected through a valve to the UHV Preparation chamber.
Pressure (min)
2 * 10-11 [mbar]
Pressure (Max)
1 * 10-7 [mbar]
Temperature
10 - 400 [K]
Description
In the fast-entry chamber up to two samples per time can be loaded from air and in about 60 minutes can reach a pressure of about 1*10^-6 mbar. It is connected through a valve to the UHV Heater chamber.
Pressure (min)
2 * 10-7 [mbar]
Pressure (Max)
1 * 103 [mbar]
Description
The Heater chamber houses an electron bombardment heater stage for high-temperature (up to about 2400 K) annealing of the sample and a 7-slot sample flag parking device. It has also several free flanges to mount the needed tools for the required sample preparation (cleavage, scraping, gas treatment, quartz microbalance...) and for UHV in-situ growth of thin films. It is connected through valves to the fast-entry lock and the UHV Preparation chamber.
Pressure (min)
3 * 10-10 [mbar]
Pressure (Max)
1 * 10-6 [mbar]
Temperature
300 - 2400 [K]
Description
The Preparation chamber houses the five degree of freedom liquid-He cryostat manipulator and it is normally equipped with an ion sputter gun (Varian), a quartz microbalance, and a silver evaporator. It has also several free flanges to mount the needed tools for the required sample preparation (cleavage, gas treatment...) and for UHV in-situ growth of thin films. It is connected through valves to the UHV Heater and Analysis chambers.
Pressure (min)
3 * 10-11 [bar]
Pressure (Max)
1 * 10-6 [bar]
Temperature
10 - 400 [K]
Sample Holders
Type
heating / cooling devices
Description
Home-made sample flag compatible with Omicron- and Specs-like flag sample holders. The Omicron- and Specs-like flag sample holders can be used with a suitable adapter.
Detectors
3D-VLEED Spin detector
Type
FOCUS FERRUM Spin detector with MBS Spin Manipulator
Description
The spin detection in the FERRUM is based on Very-Low-Energy Electron Diffraction (VLEED) where an incoming electron beam is scattered at a magnetized and oxygen passivated iron film grown on a tungsten crystal, which define the spin detector direction. The scattered electron beam is directed onto a channeltron. The MBS spin manipulator in front of the FERRUM is used to change the electron spin directions to the spin detector direction, enabling a general analysis of the 3 spin vector components.
Detection
Detected Particle
Electron
Degrees Of Freedom
3
Fast 2D-CMOS imaging detector
Type
CMOS image sensor
Description
CMOS Video Camera, Toshiba BU160M with 35 mm lens M118FM35, with high frame rate (240 fps), global electronic shutter (similar to a CCD image sensor: clear images of even fast-moving object are obtainable with less blur), and USB 3.1.
Time Resolved
Yes
Pixel Size
X = 3.45 [um], Y = 3.45 [um]
Array Size
X = 1440 [pixel], Y = 1080 [pixel]
Passive or Active (Electronics)
Active
Detection
Detected Particle
Electron
Degrees Of Freedom
3
Techniques
Photoelectron emission
- Angular Resolved PES
- Photoelectron diffraction
- Spin-resolved ARPES
- UPS
- XPS
Disciplines
Chemistry
- Other - Chemistry
Material Sciences
- Knowledge based multifunctional materials
- Other - Material Sciences
Physics
- Hard condensed matter - electronic properties
- Nanophysics & physics of confined matter
- Surfaces, interfaces and thin films
Address
BaDElPh@VUV beamline
Elettra - Sincrotrone Trieste S.C.p.A.
S.S. 14 Km 163.5 in AREA Science Park
34149 Basovizza, Trieste
Italy
Elettra - Sincrotrone Trieste S.C.p.A.
S.S. 14 Km 163.5 in AREA Science Park
34149 Basovizza, Trieste
Italy
control/Data analysis
Control Software Type
- LabVIEW
Data Output Type
- Spectra, images
Data Output Format
- Igor, krx, txt formats
Softwares For Data Analysis
- Igor Pro
Equipment That Can Be Brought By The User
Evaporators and other tools for sample preparation usually not available at the beamline. Anyway, users are invited to verified with the local contact on the possibility to connect their own equipment at the beamline end station.
