Laserlab-Europe
ULF-FORTH Attosecond Science

Attosecond Science and Technolgy Laboratory:

 

The activity focuses on the generation, characterization and applications of intense Extreme Ultraviolet (EUV) radiation emitted in the form of pulses of duration less than 1fs (attosecond pulses). It targets the development, upgrades and running of a state of the art, table top, attosecond facility dedicated to the investigation of ultrafast dynamics in all states of matter, as well as of non-linear and strong field phenomena induced solely by the EUV radiation.

 

 

 

Laser-based light source parameters

MWatt and GWatt XUV pulsed sources based on gas phase high-order-harmonic generation.

Source type
Coherent XUV pulses sources driven by a 20 TWatt Ti:S laser system which delivers 20 fs pulses at 10 Hz rep. rate.
Photon energy range / wavelength range
15 - 35 [eV]
Peak Photon energy / central wavelenght
20 [eV]
Spectral Bandwidth FWHM / %
15000 - 35000 [meV]
Tunability
0 * 101 [%]
Beam shape
Gaussian
Pulse duration FWHM
10 [fs]
Polarisation
Linear Horizontal
Pulse repetition rate
10 [Hz]
Maximum pulse energy
0.2 [mJ]
Peak power
20 * 109 [W]
Peak intensity on target
1 * 1015 [W/cm2]
Source size (spot)
X = 1.5 [um2], Y = 1.5 [um2]
Beam diameter
3 [mm]
Macropulse (train) duration
10 * 10-15 [sec]
Additional Lightsources

100GW Ti:S laser system

Laser type
Ti:S
Central Wavelength/Energy
800 * 101 [nm]
Wavelength fluctuations
1 * 10-2 [%]
Spectral Bandwidth FWHM
780 - 820 [nm]
Tunability
0 * 101 [%]
Beam shape
Gaussian
Pulse duration FWHM
30 [fs]
Polarisation
Linear Horizontal
Pulse repetition rate
1000 [Hz]
Maximum pulse energy
3 [mJ]
Peak power
100 * 109 [W]

20-TW Ti:S laser system

Laser type
Ti:S
Central Wavelength/Energy
800 [nm]
Wavelength fluctuations
1 * 10-2 [%]
Spectral Bandwidth FWHM
770 - 850 [nm]
Beam shape
Flat top
Pulse duration FWHM
20 [fs]
Polarisation
Linear Horizontal
Pulse repetition rate
10 [Hz]
Maximum pulse energy
390 [mJ]
Peak power
20 * 1012 [W]
Contrast
1 * 10-9 [ps]
Optics

IR and XUV optics

Diagnostics
Surface quality diagnostics
Other Optics
IR/XUV plane and focusing mirrors, IR focusing lens, Split mirrors for XUV-pump-XUV-probe experiments, IR beam splitters, BBO crystals, Harmonic separators, IR neutral density filters, zero and multiple order λ/2 and λ/4 IR plates etc.
Endstations or Setup

Endstations for pump-probe studies in gas phase media

Spectrometer
Flat field XUV spectrometers
Base Pressure
1 * 10-7 [mbar]
Detectors Available
Endstation Operative
Yes

Sample

Sample Type
Gas
Mounting Type
pulsed nozzles or needle valves
Required Sample Size
X = 3 [mm], Y = 3 [mm], Z = 3 [mm]

Manipulator or Sample stage

Positioning Precision
X = 100 [um], Y = 100 [um], Z = 100 [um]
Range Of Movement
X = 10 [mm], Y = 10 [mm], Z = 10 [mm]
Detectors

IR/XUV photon detectors and electron/ion TOF spectrometers

Type
IR viewers, CCD cameras, MCP+Phosphor screen XUV beam profilers, XUV calibrated photodiodes, photomultipliers, single photon counters,
TOF ion mass spectrometer, TOF electron spectrometer, Magnetic bottle TOF electron spectrometer, Time gated ion microscopy (Ion Microscope)
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron
contacts
Dimitris Charalambidis
Paraskevas Tzallas
Techniques
Absorption
  • Time-resolved studies
Disciplines
Physics
  • Other - Physics
Address
Foundation for Research and Technology-Hellas, Institute of Electronic Structure & Laser
N. Plastira 100, Vassilika Vouton 70013
Heraklion (Crete)
Greece
control/Data analysis
Control Software Type
  • to be completed
Data Output Type
  • to be completed
Data Output Format
  • to be completed
Equipment That Can Be Brought By The User
Equipment can be brought upon discussion and agreement with the local team.