BL 10.1 L - X-ray fluorescence


X-Ray Fluorescence is a highly versatile beamline developed by Elettra Sincrotrone Trieste. The beamline is optically designed to present beam parameters needed for high level measurements in spectroscopy as well as in microscopy.

The beamline will host in the near future (beginning 2014) an ultra-high vacuum chamber, project of the IAEA, which will allow the synergistic application of various X-Ray Spectrometry Techniques such as Grazing Incidence X-Ray Fluorescence (GI-XRF), Grazing Exit XRF, Total Reflection XRF (TXRF), X-ray Absorption Near Edge Structure – XANES and X-Ray Reflectometry.

Beamline Energy Resolution
600 [eV] @ 8000 [eV]
Beamline Resolving Power
1.4 * 10-4 [E/deltaE] @ 8000 [eV]
Beamline Energy Range
0.7 - 14 [keV]
Max Flux On Sample
5 * 109 [ph/s] @ 5500 [eV]
Angle Of Incidence Light On Sample Value
0 - 3.14 [degrees]
Emission or Reflection
  • Reflectrometry
  • X-ray fluorescence (XRF)
control/Data analysis
Control Software Type
  • tango and labview
Data Output Type
  • spectra
Data Output Format
  • to be completed