Welcome to the MCX beamline!

The Materials Characterisation by X-ray diffraction (MCX) beamline allows to perform a wide range of non-single crystal diffraction experiments: grazing angle diffraction and reflectivity, residual stress and texture analysis, phase identification and structural studies and kinetic studies . Systems that can be investigated vary from organic and inorganic thin films, to thermally and/or mechanically modified surfaces of mechanic components, to polymers, catalysts and highly disordered materials in the form of films, powders, fibers. In addition to the scientific heritage, a valuable activity will be the support to technology and industrial production, both for specific tasks of non-destructive control and for the development of new products.