SIXS (Surface Interface X-ray Scattering) is a wide-energy range (5-20 keV) beamline dedicated to structural characterization of interfaces (gas-solid, solid-solid or solid-liquid), as well as nano-objects in controlled environments by means of surface-sensitive x-rayscattering techniques, such as:
- Grazing Incidence X-ray Diffraction (GIXD),
- Crystal Truncation Rods (CTR),
- Grazing Incidence Small Angle X-ray Scattering (GISAXS),
- Anomalous Surface X-ray Scattering,
- X-ray Reflectivity (XRR) ,
- Coherent Diffraction,
- Magnetic Surface X-ray Scattering (in the near future).
There are two experimental end-stations: the first station, MED (Multi-Environment Diffractometer) can accommodate various sample environments, such as high-pressure reactivity chambers, electrochemical cells, Langmuir troughs. The second station, UHV is based on a diffractometer coupled to a stationary assembly of UHV chambers; it is a unique design, and consists of an assembly of three chambers equipped with the standard UHV tools (evaporators, ion-guns, etc.) and allows the samples to be characterized by diiferent methods, such as Scanning Tunneling Microscope (STM), Low Energy Electron Diffraction (LEED), Auger Electron Spectroscopy (AES).