ANTARES is an instrument dedicated to Angle Resolved Photoelectron Spectroscopy (ARPES) with high spatial resolution. This setup offers a spectroscopic momentum- and space-resolved probe with lateral size of 0.6 micron (nanoARPES) to study the electronic structure of advanced materials. 
This spectro-microscope is using high-resolution MBS A1 analyser with deflectors, ensuring the high energy and k space resolution to settle even tiny features in complex electronic band structures. The sample is cooled down to 70 K. The beamline was designed to cover with two undulators a large range of photon energies from 10 eV to 900 eV, in circular and linear polarisation, and is equipped with a high-resolution VLS PGM monochromator. The most recent advancement is in-operando setup, comprising 3 electrical connections to the sample under study.
ANTARES functionality of an ARPES microscope is in demand in the fields of studies dedicated to two dimensional heterostructures. In the heterostructures manufactured of micron-sized flakes of 2D layers today one can fine-tune their electronic structure by using different materials, adjusting their mutual orientation, varying with voltage chemical potential, strain, etc. etc. The submicron spot of nanoARPES instrument offers a unique opportunity to study directly their electronic dispersion in-operando. 
Other applications of nanoARPES technique include, at least, crystals with ultra-small sizes, and polycrystalline materials, electronic bands on different crystals terminations on cleaved crystals, etc. The in-operando technique could be used to analyse distribution of the electric potential inside the protype device. The instrument is in continuous development and is team is open to discuss the new applications.

Beamline Energy Resolution
15 [meV] @ 100 [eV]
Beamline Resolving Power
6700 [E/deltaE] @ 100 [eV]
Beamline Energy Range
20 - 900 [eV]
Max Flux On Sample
5 * 109 [ph/s] @ 100 [eV]
1 * 1011 [ph/s] @ 100 [eV]
Spot Size On Sample Hor
0.6 - 200 [um]
Spot Size On Sample Vert
0.6 - 200 [um]
Photon Sources

Apple II HU60

Type
Undulator
Available Polarization
Linear horizontal, Linear variable, Circular
Energy Range
95 - 1000 [eV]
Period
60 [mm]

Electromagnetic HU256

Type
Undulator
Available Polarization
Linear horizontal, Linear variable, Circular
Variable Polarization
Yes
Energy Range
10 - 200 [eV]
Number Of Periods
14
Period
256 [mm]
Monochromators

Monochromator

Energy Range
10 - 1000 [eV]
Type
VLS PGM (Bestec)
Resolving Power
30 * 103 [deltaE/E] @ 60 [eV]
Number Of Gratings
2
Grating Type
VLS
Other Optics

Pseudo-Wolter mirrors

Description
Beamline is equipped with two pairs of pseudo-Wolter mirrors. The pairs are interchangeable after the exit slit of the monochromator. The first pair is dedicated to the illumination of micro-focsuing optics in the endstation (Fresnel zone plate, capillary mirror), the second pair - to the macro-spot focus on the sample.
Endstations or Setup

Electron spectrometer with spatial and angular resolution

Description
Electron spectrometer with spatial and angular resolution
Base Pressure
2 * 10-10 [mbar]
Detectors Available
Hemispherical electron analyser
Endstation Operative
Yes

Sample

Sample Type
Crystal, Amorphous, Fiber, Gel
Other Sample Type
Solid and sufficiently conductive. The surface should be representatively clean at atomic level.
Mounting Type
Omicron-type sample plate
Required Sample Size
X = 10 [um], Y = 10 [um], Z = 5 [um]

Manipulator or Sample stage

Description
The scanning stage for positioning of sample, oritneation of sample with respect tot the detector and scanning photoemission imaging

Translator Stages : linear - coarse and fine, both scanning, rotation

Degrees of freedom : 3 Linear, 2 rotation, around sample normal (azimuth) and around vertical axis (polar, with horizontal slit of electron analyser detector)
Degrees Of Freedom
5
Translator Stages
3
Positioning Precision
X = 10 [nm]
Range Of Movement
X = 300 [um]

Sample Environment

Description
The sample for photoemission should have the atomically clean surface, be conductive and solid

Humidity : excluded
Pressure (min)
2 * 10-10 [mbar]
Pressure (Max)
2 * 10-8 [mbar]
Temperature
70 - 300 [K]

Sample Holders

Type
Custom omicron-type sample holder, including modification with 3 contacts
Detectors

Hemispherical electron analyser

Type
Hemispherical electron analyser
Description
Hemispherical electron analyser, MB Scientific, A1
Array Size
X = 1200 [pixel], Y = 1200 [pixel]

Detection

Detected Particle
Electron
contacts
DUDIN Pavel
AVILA Jose
PEI Ding
Techniques
Absorption
  • NEXAFS
  • XMCD
Imaging
  • Medical application
  • Photoemission EM
  • Scanning photoemission EM
  • X-ray microscopy
Photoelectron emission
  • Angular Resolved PES
  • Photoelectron diffraction
  • UPS
  • XPS
Disciplines
Chemistry
  • Catalysis
  • Electrochemistry
Engineering & Technology
  • Nanotechnology & production processes
Material Sciences
  • Technique Development - Material Sciences
Physics
  • Hard condensed matter - electronic properties
  • Nanophysics & physics of confined matter
  • Surfaces, interfaces and thin films
  • Technique Development - Physics
control/Data analysis
Control Software Type
  • TANGO, COOX, SALSA
Data Output Type
  • IGOR and NEXUS
Data Output Format
  • IGOR and NEXUS
Softwares For Data Analysis
  • IGOR Pro