European Synchrotron Radiation Facility
BM05 - Instrumentation Facility

The BM05 beamline serves as a test and development station for X-ray optical elements, beam characterisation (coherence, polarisation…), and instrumentation R&D in general. The beamline is available for internal development and for proprietary research.

Beamline Energy Resolution
0.5 [eV]
Beamline Resolving Power
1 * 10-4 [deltaE/E] @ 20000 [eV]
3.7 * 10-2 [deltaE/E] @ 20000 [eV]
Beamline Energy Range
6000 - 60000 [eV]
Max Flux On Sample
1.6 * 1010 [ph/s] @ 25000 [eV]
Spot Size On Sample Hor
0.002 - 100 [mm]
Spot Size On Sample Vert
0.002 - 6 [mm]
Divergence Hor
2.4 [mrad]
Divergence Vert
0.083 [mrad]
Transverse Coherence Length At Sample Position Vert Value
64 - 88 [um]
Transverse Coherence Length At Sample Position Hor Value
6 - 9 [um]
Angle Of Incidence Light On Sample Value
0 - 120 [degrees]

Double -Crystal monochromator

Energy Range
6000 - 60000 [eV]
Cryo-cooled, double-reflection Si(111) monochromator
Resolving Power
1 * 10-4 [deltaE/E] @ 20000 [eV]

Double-Multilayer Monochromator

Energy Range
8000 - 30000 [eV]
Double-reflection, variable-exit multilayer monochromator
Resolving Power
1 * 10-2 [deltaE/E] @ 20000 [eV]
Endstations or Setup

5-circle diffractometer

5-circle commercial diffractometer (3 circles for sample orientation, 2 circles for detectors) financed by the French IRT Nanoelec programme, collaboration CEA-LETI / ESRF.
Station for high-throughput multi-characterisation R&D rapid-access needs of the micro- and nano-electronics industry.
Available X-ray characterisation techniques: in-plane and out-of-plane diffraction, both in reflection and transmission, anomalous diffraction, CD-SAXS, PDF measurements on amorphous thin layers, fluorescence, reflectivity and diffraction imaging (white and monochromatic x-ray topography, rocking curve imaging). Maximum size of 120 mm x 6 mm in the monochromatic case or of 165 mm x 7 mm in the case of white beam (FWHM). The setup is also used to measure diffuse scattering on polished surfaces or to qualify the uniformity response of detectors.
A bent multilayer bending mounted upstream (optics table) may be used to concentrate the x-ray beam in the horizontal direction down to 30 micrometers.
Base Pressure
1 * 103 [mbar]
Endstation Operative

Manipulator or Sample stage

Horizontal diffractometer

Horizontal diffractometer allowing multiple configurations using up to 3-axis for reciprocal space mapping. Can take sample environments of up to 100 kg weight. X-ray diffractometry with micrometer spatial resolution can be performed using a FreLon camera. Optional micro-focusing optics element (Kirkpatrick-Baez or refractive lenses) available on 1st axis . Notice also that white beam can also be used in this hutch.
Endstation Operative

Manipulator or Sample stage

Medium-resolution micro-tomograph

Base Pressure
1 * 103 [mbar]
Endstation Operative

Manipulator or Sample stage

Eric Ziegler
Sebastien Berujon
Thu-Nhi Tran Caliste
  • Crystallography
  • Time-resolved studies
  • Topography
Emission or Reflection
  • Reflectrometry
  • Time-resolved studies
  • X-ray tomography
  • Elastic scattering
  • Small angle scattering
  • Time-resolved scattering
Engineering & Technology
  • Other - Engineering & Technology
Material Sciences
  • Other - Material Sciences
ESRF, S03, 71 avenue des martyrs, 38000 Grenoble
control/Data analysis
Control Software Type
  • Spec
Data Output Type
Data Output Format
Softwares For Data Analysis
  • PyHST, PyMCA
Equipment That Can Be Brought By The User
Various customizable stations located at ~28 m, ~40 m and ~55 m from the source where either white beam or monochromatic beam can be delivered. Contact one of the beamline contacts for specifics.
Other Equipment Available On Site
Various detectors available through our pool of equipment: scintillator counter, ionization chamber, Si-PIN diode, FReLoN and PCO 2D imaging cameras
in partnership with