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European Synchrotron Radiation Facility
ID06-HXM - Hard X-ray Microscopy Beamline

ID06 HXRM is a hard X-ray microscopy beamline for the study of a wide range of materials, ranging from structural materials such as metals and alloys to functional materials such as ferroelectrics to biominerals. The main technique offered is dark field X-ray microscopy.

More details and references can be found in this publication:

Kutsal, M., Bernard, P., Berruyer, G., Cook, P. K., Hino, R., Jakobsen, A. C., … Detlefs, C. (2019). The ESRF dark-field x-ray microscope at ID06. IOP Conference Series: Materials Science and Engineering, 580, 012007. https://doi.org/10.1088/1757-899X/580/1/012007.

Publications Website
Beamline Energy Range
11 - 55 [keV]
Max Flux On Sample
1 * 1013 [ph/s]
Spot Size On Sample Hor
30 - 2000 [um]
Spot Size On Sample Vert
0.5 - 500 [um]
Photon Sources

CPMU18

Type
Undulator
Available Polarization
Linear horizontal
Deflection Parameter K
1.5
Energy Range
11 - 55 [keV]
Period
18 [mm]
Monochromators

Cinel Si(111)

Energy Range
7.5 - 55 [keV]
Type
Si (111) double crystal monochromator with liquid nitrogen cooling.

This is the default monochromator
Resolving Power
1.4 * 10-4 [deltaE/E]

Cinel Si(311)

Energy Range
15 - 99 [keV]
Type
Si (311) double crystal monochromator with liquid nitrogen cooling

available only after discussion with beamline staff.
Other Optics

Compound refractive lenses

Description
Compound refractive lenses can be used as collimator (in the optics hutch), condenser (ca 0.3-1m upstream of the sample) and imaging optics (ca 0.2-0.5m downstream of the sample)
Endstations or Setup

Hard x-ray microscope

Description
See Kutsal, M., Bernard, P., Berruyer, G., Cook, P. K., Hino, R., Jakobsen, A. C., … Detlefs, C. (2019). The ESRF dark-field x-ray microscope at ID06. IOP Conference Series: Materials Science and Engineering, 580, 012007. https://doi.org/10.1088/1757-899X/580/1/012007.

Sample

Sample Type
Crystal, Other: polycrystalline solid
Mounting Type
in air
Required Sample Size
X = 100 [um], Y = 100 [um], Z = 1000 [um]

Techniques usage

Diffraction / Crystallography
See Kutsal, M., Bernard, P., Berruyer, G., Cook, P. K., Hino, R., Jakobsen, A. C., … Detlefs, C. (2019). The ESRF dark-field x-ray microscope at ID06. IOP Conference Series: Materials Science and Engineering, 580, 012007. https://doi.org/10.1088/1757-899X/580/1/012007.
Diffraction / Topography
See Kutsal, M., Bernard, P., Berruyer, G., Cook, P. K., Hino, R., Jakobsen, A. C., … Detlefs, C. (2019). The ESRF dark-field x-ray microscope at ID06. IOP Conference Series: Materials Science and Engineering, 580, 012007. https://doi.org/10.1088/1757-899X/580/1/012007.
Imaging / X-ray microscopy
See Kutsal, M., Bernard, P., Berruyer, G., Cook, P. K., Hino, R., Jakobsen, A. C., … Detlefs, C. (2019). The ESRF dark-field x-ray microscope at ID06. IOP Conference Series: Materials Science and Engineering, 580, 012007. https://doi.org/10.1088/1757-899X/580/1/012007.
Detectors

Diffraction camera

Type
2D indirect detector
Description
A diffraction camera with large pixels can provide 3DXRD type mapping as well as classical (sample averaged) diffraction information.
Pixel Size
X = 47.5 [um], Y = 47.5 [um]
Array Size
X = 2000 [pixel], Y = 2000 [pixel]

Detection

Detected Particle
Photon
Degrees Of Freedom
2

Far field camera

Type
2D indirect detector
Description
High-resolution 2D detector for x-ray microscopy
Pixel Size
X = 1.6 [um], Y = 1.6 [um]
Array Size
X = 2000 [pixel], Y = 2000 [pixel]

Detection

Detected Particle
Photon
Degrees Of Freedom
2

Near field camera

Type
Indirect 2D detector
Description
A near-field camera with high resolution placed close to the sample can provide classical absorption or phase contrast tomography, non-magnified diffraction topographies, and DCT measurements.
Array Size
X = 2000 [pixel], Y = 2000 [pixel]

Detection

Detected Particle
Photon
Degrees Of Freedom
2
contacts
Carsten Detlefs
Techniques
Diffraction
  • Crystallography
  • Topography
Imaging
  • X-ray microscopy
Disciplines
Energy
  • Sustainable energy systems
  • Technique Development - Energy
Life Sciences & Biotech
  • Other - Life Sciences & Biotech
Material Sciences
  • Knowledge based multifunctional materials
  • Metallurgy
  • Technique Development - Material Sciences
Physics
  • Hard condensed matter - structures
  • Technique Development - Physics
Address
European Synchrotron Radiation Facility
71, avenue des Martyrs
CS 40220
38043 Grenoble Cedex 9
control/Data analysis
Control Software Type
  • SPEC
Data Output Type
  • SPEC data file, image files
Data Output Format
  • SPEC data file, .EDF image files

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