The FlexPES (Flexible PhotoElectron Spectroscopy) beamline caters for the experimental needs of both Surface/Material Science and Low Density Matter user communities offering the possibility to perform a variety of photoemission and soft X-ray absorption experiments in the photon energy range 40 – 1500 eV. The two-branch configuration with double-striped toroidal refocusing mirrors ensures maximum flexibility – up to four endstations can be accommodated on the two branches of the beamline simultaneously, and each of these endstations can avail of different focusing conditions. The end stations offer a diverse range of experimental techniques, detectors and sample handling facilities and can be used with a variety of sample delivery systems.

Endstations or Setup

LDM ICE endstation

Description
LDM ICE endstation:
The ICE (Ions in Coincidence with Electrons) end station is a mobile end station that is designed to be compatible with a number of MAX IV LDM-relevant beamlines.
Spectrometer
The ICE REMI (REaction MIcroscope) based on a RoentDek spectrometer with current length of 1 m, and adjustable electrostatic field geometry.
Base Pressure
1 * 10-9 [mbar]

Sample

Sample Type
Liquid, Gas

Sample Environment

Description
Liquid-microjet source:
Quartz glass nozzles, typical opening diameter 20-25 µm.
Liquid delivery with an HPLC pump. Typical flow 0.5 - 1 ml/min.
Degassing with DEGASi PLUS Semi-Prep, 4-ch, 925μl.
Cooling and heating of liquid.
Description
Molecular-jet source:
Adiabatic expansion source with cylindrical sample reservoir. Reservoir heating and nozzle heating possible.
Temperature
295 - 423 [K]

LDM-PES endstation

Description
LDM-PES endstation:
High-resolution photo-electron spectroscopy on low-density material samples.

Based on 3 chambers:
1. Ionization and analysis chamber.
2. Preparation chamber.
3. Sample introduction chamber.

Sample delivery systems: Liquid jet setup, molecular jet source, and a gas cell.
Spectrometer
Scienta SES R4000 electron spectrometer
Endstation Operative
Yes

Sample

Sample Type
Liquid, Gas, Other: Surfaces and thin films

Manipulator or Sample stage

Description
Preparation chamber:
XYZ VG Omniax manipulator with a rotation stage in horizontal arrangement
Degrees Of Freedom
4
Translator Stages
3
Cradles
1
Range Of Movement
X = 25 [mm], Y = 25 [mm], Z = 600 [mm]

Sample Environment

Description
Ionization and analysis chamber:
Magnetic shielding with μ-metal liner.
Dosing system with 4 gas lines and 1 vapor line
Solid samples on sample manipulator
Molecular/cluster beams from a dedicated sample delivery system.
Liquid beams from a dedicated liquid jet source.
Pressure (min)
1 * 10-8 [mbar]
Description
Preparation chamber:
Sputter gun and gas dosing available (4 gas lines and 1 vapor line).
Pressure (min)
1 * 10-9 [mbar]
Description
Sample introduction chamber:
Magnetic transfer arm.
Capacity to store 6 samples.
Pressure (min)
1 * 10-8 [mbar]

Surface & Material Science (SMS) endstation

Description
Surface & Materials Science:
High-resolution photoelectron spectroscopy (PES) on solid samples using SES-2002 analyzer and 4-axis manipulator; X-ray absorption spectroscopy (XAS or NEXAFS) using total and partial electron yield.

The endstation contains the following 4 chambers:
1. Analysis chamber.
2. Main preparation chamber.
3. Secondary preparation chamber
4. Fast-entry chamber.
Spectrometer
Scienta SES-2002 electron spectrometer.
Endstation Operative
Yes

Sample

Sample Type
Other: Surfaces and thin films

Manipulator or Sample stage

Description
Analysis chamber:
4-axis LHe/LN2 manipulator (VG Omniax):
3 motorized translations and 1 motorized rotation (360° polar angle).
Degrees Of Freedom
4
Translator Stages
3
Cradles
1
Range Of Movement
X = 25 [mm], Y = 25 [mm], Z = 600 [mm]
Description
Main preparation chamber:
4-axis LHe/LN2 manipulator (VG Omniax):
3 motorized translations and 1 motorized rotation (360° polar angle).
Magnetic transfer arms (FerroVac).
Degrees Of Freedom
4
Translator Stages
3
Cradles
1
Range Of Movement
X = 25 [mm], Y = 25 [mm], Z = 600 [mm]
Description
Second preparation chamber:
4-axis LN2 manipulator (Prevac, customized):
3 translations and 1 rotation (-180°…+150° polar rotation).
Z-translation and rotation are motorized.
Magnetic transfer arms (FerroVac).
Degrees Of Freedom
4
Translator Stages
3
Cradles
1
Range Of Movement
X = 25 [um], Y = 25 [um], Z = 150 [um]

Sample Environment

Description
Analysis chamber:
Open-cycle He-flow cryostat (modified Janis ST-400).
On-sample K-type thermocouple sensors. Si-diode sensors available for higher low-T precision.
Magnetic shielding with a μ-metal liner.
Pressure (min)
1 * 10-10 [mbar]
Temperature
21 - 300 [K]
Description
Fast-entry chamber:
Capacity to store 6 sample plates.
Pressure (min)
5 * 10-8 [mbar]
Description
Main preparation chamber:
Sputter gun, heating and cooling available.
On-sample K-type thermocouple sensors.
Dosing with 4 separate gas lines and 1 liquid vapor line.
Sample storage for up to 6 samples in UHV.
Pressure (min)
1 * 10-10 [mbar]
Temperature
21 - 1673 [K]
Description
Secondary preparation chamber:
Sputter gun and heating available.
On-sample K-type thermocouple sensor.
Pressure (min)
1 * 10-10 [mbar]
Temperature
295 - 1673 [K]

Sample Holders

Type
Omicron flag-type sample holder.
Detectors

Analyzer detector - SMS endstation

Type
Scienta SES-2002 electron spectrometer coupled to a 40 mm MCP/CCD detector.
Description
Energy resolution: < 2 meV FWHM at 2 eV pass energy and 20 eV kinetic energy.
Angular resolution: < 0.1 degree
Slits in mm: 0.2s, 1.5s, 2.5s, 4.0s with slit length of 30 mm
0.2c, 0.3c, 0.5c, 0.8c with slit length of 25 mm
(s = straight, c = curved)
Transmission mode
Angular mode: ±3.5°,±7°

Detection

Detected Particle
Electron

NEXAFS e-detectors - SMS endstation

Type
NEXAFS e-detectors
Description
NEXAFS MCP detector for PEY and TEY experiments.
NEXAFS in TEY mode via sample drain current.

Detection

Detected Particle
Electron

NEXAFS photon detectors - SMS endstation

Type
NEXAFS photon detector
Description
NEXAFS in partial FY mode with Sirius 70 mm2 active area SDD (Rayspec).
Atomic Composition
Silicon

Detection

Detected Particle
Photon
contacts
Alexei Preobrajenski
Techniques
Absorption
  • NEXAFS
Photoelectron emission
  • XPS
control/Data analysis
Control Software Type
  • TBC
Data Output Type
  • TBC
Data Output Format
  • TBC