PHELIX is a beamline using soft X-rays, the source of which is an APPLE II undulator with permanent magnets.

This type of insertion device gives the opportunity to obtain a variable polarization of light: linear polarization at any angle as well as circular and elliptical polarization.

The PHELIX end-station enables a wide range of spectroscopic and absorption studies characterized by different surface sensitivity. Besides collecting standard high-resolution spectra, it allows, e.g. to map the band structure in three dimensions and to detect the spin in three dimensions.

The main components of the PHELIX end-station are as follows:

well-equipped analysis chamber with hemispherical photoelectron energy analyzer with resolution ~1 meV, 3D spin detector VLEED-type, total fluorescence detector and additional sources of radiation (X, UV) enabling operation without a beam,
preparation chamber with effusion cells and EBVs for in situ thin layers deposition with precise control of their thickness, LEED diffractometer, leak valves enabling operation with various gases and a sample stage allowing samples to be heated up to 2000°C,
crystal cleaver chamber allowing to expose atomically smooth surfaces under ultra-high vacuum conditions.

  • new materials for spintronics and magnetoelectronics, topological insulators
  • thin films and multilayers systems including samples obtained in-situ
  • surface of bulk compounds
  • surface magnetism, spin polarized surface states
  • chemical reactions taking place on the surface
  • biomaterials.
Beamline Energy Resolution
5 [meV] @ 50 [eV]
Beamline Resolving Power
1 * 104 [deltaE/E] @ 50 [eV]
Beamline Energy Range
50 - 1500 [eV]
Max Flux On Sample
8.2 * 1012 [ph/s] @ 50 [eV]
Spot Size On Sample Hor
60 - 80 [um]
Spot Size On Sample Vert
10 - 30 [um]
Divergence Hor
35 - 80 [urad]
Divergence Vert
15 - 70 [urad]
Angle Of Incidence Light On Sample Value
1 - 90 [degrees]
Photon Sources


Available Polarization
Linear horizontal, Linear vertical, Linear variable, Elliptical, Circular
Variable Polarization
Source Divergence Sigma
X = 78 [urad], Y = 72 [urad]
Source Size Sigma
X = 185 [um], Y = 31 [um]
Source Spectral Flux
1.5 * 1015 [ph/s/0.1%bw] @ 50 [eV]
Deflection Parameter K
3.68 [47 eV/linear pol.]
Energy Range
50 - 1500 [eV]
Total Power
1300 [W]
Number Of Periods
5.8 [cm]


Energy Range
50 - 1500 [eV]
Resolving Power
10000 [deltaE/E] @ 50 [eV]
Number Of Gratings
Grating Type
lamellar gratings - 600 l/mm, 800 l/mm, 1200 l/mm.
Tomasz Sobol
  • XMCD
Photoelectron emission
  • Angular Resolved PES
  • Spin-resolved ARPES
  • XPS
  • Catalysis
  • Physical Chemistry
  • Hard condensed matter - electronic properties
  • Nanophysics & physics of confined matter
  • Other - Physics
  • Surfaces, interfaces and thin films
Czerwone Maki 98
30-392 Krakow, Poland
control/Data analysis
Control Software Type
  • SpeecsLab2, Custom develop code (Graphical user interface)
Data Output Type
  • Igor, VAMAS, xy,
Data Output Format
  • sle, xml, vms, itx
Softwares For Data Analysis
  • Igor, OriginPro, SpeecsLab Prodigy...
Equipment That Can Be Brought By The User
evaporators, leak valves, vacuum suitcase, compatible with the system