P02.2 Extreme Conditions

P02.2 is the Extreme Conditions Beamline (ECB) at PETRA III. The beamline focuses on harvesting very brilliant X-rays of PETRA III to conduct diffraction experiments at relative high energies on both single crystal and powders and extreme conditions of high-pressure and simultanous high/low temperatures. The high brilliance in combination with fast area detectors enables furthermore time resolved diffraction experiments at the hundreds of micro seconds time scale.

PETRA III is one of the foremost 3rd generation synchrotron facilities in the world due to its low emittance storage ring that creates a very small and highly brilliant source especially at high energies. Such a source is ideally suited for experiments at extreme conditions since they require hard X-rays with high brilliance and a small focus. The Extreme Conditions Beamline (ECB), is optimized for micro powder and single crystal diffraction at simultaneous high pressure and high/low temperatures in the Diamond Anvil Cell (DAC) and the Paris Edinburgh Press. The ability to create extreme conditions is complemented by time resolved diffraction capabilities in order to explore the kinetics of physical processes such as meta-stabilities during a phase transition.

The above requirements have been realized by:

  • Offering micro focus of 2 (H) x 2 (V) micron2 (Kirkpatrick Baez (KB) Mirrors) and 8 (H) x 3 (V) micron2 FWHM (Compound Reflective Lenses, CRL) at energies of 25.6, 42.7 (CRL). More recently the beamline has also established a submicron 0.85 (H) x 0.85 (V) micron2 beam (CRL) at 25.6 keV to meet the ever growing demands for such focus at high energies.
  • Employing fast 2D area detectors from Perkin Elmer (XRD1621) and two GaAs LAMBDA detectors (operating at 2 kHz) enables the very fast collection of diffraction images.
  • Providing various sample environments to generate high-pressures and simultaneous high/low temperatures. P02.2 conists of two experimental setups, the laser heating (LH) and the general purpose (GP) experiment, where the GP experiments accepts all sample environments other than laser heating, e.g. cryostats and resistive heating
Beamline Energy Resolution
2 * 10-4 [meV] @ 42.7 [eV]
2 * 10-4 [meV] @ 25.6 [eV]
Beamline Resolving Power
5 * 102 [deltaE/E] @ 25.6 [eV]
5 * 102 [deltaE/E] @ 42.7 [eV]
Beamline Energy Range
25600 - 42700 [eV]
Max Flux On Sample
1 * 1012 [ph/s] @ 25.6 [eV]
8 * 1010 [ph/s] @ 42.7 [eV]
Spot Size On Sample Hor
2 - 700 [um]
Spot Size On Sample Vert
2 - 900 [um]
Divergence Hor
0.1 - 1.3 [mrad]
Divergence Vert
0.2 - 0.65 [mrad]
Hanns-Peter Liermann (P02.2)
Konstantin Glazyrin (P02.2)
  • Crystallography
  • Powder diffraction
  • Time-resolved studies
Emission or Reflection
  • Micro XRF
  • Elastic scattering
  • Time-resolved scattering
  • Wide angle scattering
control/Data analysis
Control Software Type
  • Python
Data Output Type
  • tiff, fio (data arranged in columns)
Data Output Format
  • tiff, ascii
Softwares For Data Analysis
  • DIOPTAZ, InHouse Software (P02tool)