BM32 - Surfaces / Interfaces Beamline

French CRG IF beamline for X-ray scattering on Surfaces and Interfaces

Three instruments are available to offer a complementary and multiscale characterization of surfaces and interfaces in soft and hard condensed matter, suited to technology-related and fundamental science:

INS : In-situ study of atomic layers growth and nanoscale objects and assembly under ultra high vacuum is allowed in the Surface Ultra Vacuum. (atomic, composition and morphology with hxv (mm)= 0.5x0.2 5 10^11 ph/s monochromatic resolution 1.5 10^-4, 2D detector, surface Diffraction, GIXD, GISAXS)

GMT: The multitechnic goniometer working in air offers large possibilities to investigate ex/in situ and in operando interfaces between different elements or states of matter.(atomic, composition and morphology with hxv (mm)= 0.5x0.2 5 10^11 ph/s monochromatic resolution 1.5 10^-4, high energy reflectivitty, GIXD, GISAXS, Reci. Space Map)

Laue Microdiffraction : A station designed for submicronic focussed polychromatic beam (Laue) diffraction: 2D and 3D orientation and strain map of microstructure and microobjet, nanowire. ex/in situ in operando.

Website

Beamline Energy Resolution

3 * 10^-4 [eV] @ 19000 [eV]

Beamline Resolving Power

6.5 * 10³ [E/deltaE] @ 19000 [eV]

Beamline Energy Range

5000 - 30000 [eV]

Max Flux On Sample

5 * 10¹¹ [ph/s] @ 19 [eV]

Spot Size On Sample Hor

0.3 - 700 [um]

Spot Size On Sample Vert

0.3 - 300 [um]

Divergence Hor

0.2 - 1 [mrad]

Divergence Vert

0.1 - 1 [mrad]

contacts

Jean-Sébastien MICHA

Gilles RENAUD

Maurizio DE SANTIS

Odile ROBACH

Samuel TARDIF

Olivier ULRICH

Techniques

Diffraction

Crystallography
Surface diffraction
Time-resolved studies
Topography

Emission or Reflection

Micro XRF
Reflectrometry
X-ray excited optical luminescence (XEOL)
X-ray fluorescence (XRF)

Scattering

Anomalous scattering
Elastic scattering
Reflectivity
Resonant scattering
Small angle scattering
Time-resolved scattering
Wide angle scattering

Disciplines

Chemistry

Physical Chemistry

Earth Sciences & Environment

Mineralogy
Other - Earth Sciences & Environment

Energy

Other - Energy

Engineering & Technology

Nanotechnology & production processes

Material Sciences

Knowledge based multifunctional materials
Metallurgy
Other - Material Sciences
Technique Development - Material Sciences

Physics

Hard condensed matter - structures
Nanophysics & physics of confined matter
Soft condensed matter physics
Surfaces, interfaces and thin films

control/Data analysis

Control Software Type

SPEC, mirgration to BLISS scheduled

Data Output Type

spectra, images, strain and orientation map

Data Output Format

ascii, image (binary, tiff, ...), hdf5

Softwares For Data Analysis

ESRF and in house visualisation software, LaueTools package for microdiffraction Laue