French CRG IF beamline for X-ray scattering on Surfaces and Interfaces
Three instruments are available to offer a complementary and multiscale characterization of surfaces and interfaces in soft and hard condensed matter, suited to technology-related and fundamental science:
- INS : In-situ study of atomic layers growth and nanoscale objects and assembly under ultra high vacuum is allowed in the Surface Ultra Vacuum. (atomic, composition and morphology with hxv (mm)= 0.5x0.2 5 10^11 ph/s monochromatic resolution 1.5 10^-4, 2D detector, surface Diffraction, GIXD, GISAXS)
- GMT: The multitechnic goniometer working in air offers large possibilities to investigate ex/in situ and in operando interfaces between different elements or states of matter.(atomic, composition and morphology with hxv (mm)= 0.5x0.2 5 10^11 ph/s monochromatic resolution 1.5 10^-4, high energy reflectivitty, GIXD, GISAXS, Reci. Space Map)
- Laue Microdiffraction : A station designed for submicronic focussed polychromatic beam (Laue) diffraction: 2D and 3D orientation and strain map of microstructure and microobjet, nanowire. ex/in situ in operando.