The ID03 beamline of the ESRF is the specialized for Surface X-ray Diffraction (SXRD). SXRD is a well established technique which gives the posibility of studying the structure and/or morphology of surfaces and interfaces at atomic level.

The beamline has two experimental hutches, each hosting one diffractomneter. In the first hutch there is a vertical axis six-circle diffractometer which can carry different user-specific setups. In the second hutch there is a six-circle diffractometer coupled with a UHV system.

The science which can be carried out at the beamline ranges from the static determination of surface/interface structure to the real-time in-situ and operando experiments. Typical examples are growth processes, operando studies of catalytic reactions at "real" pressure conditions and the in-situ studies of electrochemical processes.

2D pixel detectors are permanently installed on both diffractometers.

The coherence of the source can be employed, but the beamline is not optimized for coherent diffraction experiments.

Typical techniques of the beamline:

GISAXS and GIWAXS - Small and Wide angle scattering at grazing incidence angle

SXRD - Surface X-ray Diffraction

Anomalous Diffraction and diffracted anomalous fine structure (DAFS)

EXASF and NEXASF are also possible.