European Synchrotron Radiation Facility
ID13 - Microfocus Beamline

ID13 is dedicated to high-spatial-resolution diffraction and scattering experiments using focused monochromatic x-ray beams. Two endstations, a microbranch and a nanobranch, are operated in time-sharing mode.

The principal aim of the Microfocus Beamline (ID13) is to provide small focal spots for scanning experiments in diffraction mode, small-angle X-ray scattering (SAXS) mode, or a combinations of both (SAXS/WAXS). Complementary methods like scanning X-ray microfluorescence are feasible.

 

The beamline characteristics are as follows:

    • Primary Source: 18 mm period in-vacuum undulator optimized for 12.7 keV
    • Secondary Source: 35 mm period, fully tunable undulator
    • Incident photon energy: typically 12.7 to 14 keV for microbranch, 12.7 or 15 keV for nano branch
    • Monochromatisation: liq. N2 cooled Si-111 channel cut monochromator
    • Diffraction/Scattering data are recorded using an pixel array detector (DECTRIS EIGER X 4M)

 

Experimental Hutch I:

    • This hutch is used for beam conditioning/diagnosis and not available for user experiments for the time being.

 

Experimental Hutch II:

    • x/y/z Scanning setup with air bearing rotation and tilt options.
    • Microbeam optics by Be-CRL based transfocator and defining collimator: ≥ 1.5 µm minimum beam size
    • Suitable for in situ studies (deformation, microfludics etc..)

 

Experimental Hutch III:

  • Operational since 2007
  • 80 nm to 200 nm beams using NFL (Si-based CRL's in crossed geometry) optics at 15 keV
  • 35 nm to 150 nm beam using MLL (multilayer Laue lenses in crossed geometry) at 12.7 keV
  • Target beam size: 10 nm
  • Dedicated X-ray fluorescence detector setup to accompany SAXS/WAXS experiments
Beamline Energy Resolution
1 * 10-4 [meV] @ 12.7 [eV]
Beamline Energy Range
7000 - 30000 [eV]
Max Flux On Sample
6 * 1011 [ph/s] @ 12.7 [eV]
Spot Size On Sample Hor
0.08 - 30 [um]
Spot Size On Sample Vert
0.08 - 20 [um]
Divergence Hor
0.25 - 1.5 [mrad]
Divergence Vert
0.1 - 1.5 [mrad]
Transverse Coherence Length At Sample Position Vert Value
0.05 - 250 [um]
Transverse Coherence Length At Sample Position Hor Value
0.05 - 120 [um]
contacts
Manfred BURGHAMMER
Martin Rosenthal
Techniques
Diffraction
  • Crystallography
  • Crystallography (biological macromolecules)
  • Powder diffraction
  • Time-resolved studies
Emission or Reflection
  • Micro XRF
  • X-ray fluorescence (XRF)
Scattering
  • Coherent scattering
  • Elastic scattering
  • Small angle scattering
  • Time-resolved scattering
  • Wide angle scattering
control/Data analysis
Control Software Type
  • spec
Data Output Type
  • images, spectra
Data Output Format
  • EDF format, specfiles
Softwares For Data Analysis
  • inhouse: fit2d, SAXS-utils, ilaiis
Equipment That Can Be Brought By The User
User provided sample environments such as furnaces, high pressure cells, mechanical testing devices, humidity, etc. can be used. Beamline staff should be contacted for compatibility and necessary adaptations e.g. due to spatial constraints imposed by micro-/nano-beam geometry