ELI Beamlines
Plasma X-ray Source (PXS)

 

The Plasma X-ray Source (PXS), driven by the L1 laser beam is a secondary source producing hard X-ray radiation. The femtosecond laser pulses at a repetition rate of 1kHz, are focused on a renewing liquid-metal target where they ignite a dense plasma. The plasma ionizes the target and accelerates electrons up to hundreds of keV. When these electrons fall back to the atomic ground state they create continuum and X-rays lines depending on the target material. Through an X-ray transparent window, photons will be emitted.
The main strength of the PXS is the emittance of the X-radiation in an ultrashort pulse with a typical temporal length of femtoseconds (~10-20 fs).
Due to the short pulses, the PXS is suitable to resolve the kinetics of chemical reactions on atomic scale via different techniques such as X-ray diffraction and X-ray absorption spectroscopy techniques. Artificial photosynthetic systems or photoactive biological molecules can also be tested in the PXS.

 

 

 

Laser-based light source parameters

PXS

Source type
Plasma X-ray Source (PXS)
Peak Photon energy / central wavelenght
10.8 * 103 [eV]
Fluctuations of the peak photon energy / central wavelenght
PXS not in operation yet; no measurement available.
Tunability
0 * 101 [%]
Beam shape
Other...
Other beam shape
PXS is a 4p radiation source. The beam shape will be similar to that of a light bulb.
Pulse duration FWHM
300 [fs]
Other polarisation
Driving laser shall be p-polarized to maximize X-ray output. PXS plasma does not have any polarization.
Pulse repetition rate
1000 [Hz]
Peak power
5.77 * 109 [W]
Additional Lightsources

X-ray microfocus sealed tube

Central Wavelength/Energy
0.154 [nm]
Beam shape
Gaussian
Optics

Montel optics with multilayers

Angle Of Incidence Of Light On Sample
4.8 mrad
Diagnostics
Will be mentioned
Monochromator
Yes
Other Optics
poly capillary optics
Endstations or Setup

X-ray-end-station

Microscopes
Not available
Diffractometer
Single crystal
Spectrometer
Single crystal
Detectors Available
Eiger

Sample

Sample Type
Other: User defined
Mounting Type
Manual
Required Sample Size
X = 100 [um], Y = 100 [um], Z = 100 [um]

Manipulator or Sample stage

Degrees Of Freedom
4
Cradles
1
Positioning Precision
X = 1 [um]

Sample Environment

Sample Holders

Detectors

Andor

Passive or Active (Electronics)
Active

Detection

Detected Particle
Photon

Eiger

Passive or Active (Electronics)
Active

Detection

Detected Particle
Photon

X-ray-end station

Passive or Active (Electronics)
Active

Detection

Detected Particle
Photon
contacts
{name}
{name}
Techniques
Absorption
  • EXAFS
  • IR spectroscopy
  • NEXAFS
  • Time-resolved studies
Diffraction
  • Crystallography
  • Crystallography (biological macromolecules)
  • Powder diffraction
  • Surface diffraction
  • Time-resolved studies
Emission or Reflection
  • Time-resolved studies
  • X-ray excited optical luminescence (XEOL)
  • X-ray fluorescence (XRF)
Imaging
  • X-ray microscopy
Photoelectron emission
  • Time-resolved studies
  • XPS
Scattering
  • Elastic scattering
  • Small angle scattering
  • Time-resolved scattering
  • Wide angle scattering
Disciplines
Earth Sciences & Environment
  • Water sciences/Hydrology
Humanities
  • History
Life Sciences & Biotech
  • Agriculture & Fisheries
  • Molecular and cellular biology
Physics
  • Atomic & molecular physics
  • High energy & particle physics
  • Other - Physics
  • Quantum electronics & optics
control/Data analysis
Control Software Type
  • STOE X-Area
Data Output Type
  • Binary and text
Data Output Format
  • xi, hdf5
Softwares For Data Analysis
  • XDS
Equipment That Can Be Brought By The User
Possible after discussion with the user