Elettra
BL 01.2 L - NanoESCA

Imaging XPEEM spectroscopy, microprobe ARPES and XPS

The analysis of chemical and electronic states in complex and nanostructured material systems requires electron spectroscopyto be carried out with nanometer lateral resolution, i.e. spectronanoscopy. This goal is achieved in NanoESCA instrumentby combining a parallelimaging photoelectron emission microscope with an appropriate energy filter.This instrument has a particular emphasis on the spectroscopic aspectsand enables laterally resolved photoelectron spectroscopy from the VUV up into the hard x-ray regime.

The design includes a non-magnetic, electrostatic PEEM lens and a double-pass hemispherical analyser. Rapid PEEM survey imaging(< 50 nm resolution) can be used to locate features, whilst its lateral resolution in imaging ESCA of 650 nm in the laboratory and 150 nm at the Synchrotron are simply unique.

Beamline Energy Resolution
2.5 * 10-4 [eV] @ 400 [eV]
Beamline Resolving Power
4 * 103 [E/deltaE] @ 400 [eV]
Beamline Energy Range
25 - 1000 [eV]
Max Flux On Sample
1.5 * 1013 [ph/s] @ 150 [eV]
Spot Size On Sample Hor
5 - 20 [cm]
Spot Size On Sample Vert
10 - 20 [um]
Angle Of Incidence Light On Sample Value
25 [degrees]
Photon Sources

2 Sasaki type elliptical undulators phased by an electromagnet - copy

Type
Undulator
Available Polarization
Elliptical
Variable Polarization
Yes
Source Size Sigma
X = 253 [um], Y = 18 [um]
Source Spectral Flux
2.1 * 1018 [ph/s/0.1%bw] @ 400 [eV]
Energy Range
10 - 1000 [eV]
Number Of Periods
20
Period
10 [cm]
Monochromators

SG10 Spherical grating

Energy Range
10 - 50 [eV]
Type
SGM
Resolving Power
1000 [E/deltaE] @ 20 [eV]
Number Of Gratings
1
Grating Type
Spherical Grating

VLS 200 grating

Energy Range
50 - 300 [eV]
Type
Variable Line Spacing
Resolving Power
4000 [E/deltaE] @ 200 [eV]
Number Of Gratings
1
Grating Type
VLS200

VLS 400 grating

Energy Range
100 - 1000 [eV]
Type
Variable Line Spacing Grating
Resolving Power
4000 [E/deltaE] @ 400 [eV]
Number Of Gratings
1
Grating Type
Variable Line Spacing
contacts
Vitaliy Feyer
Techniques
Absorption
  • NEXAFS
  • XMCD
Diffraction
  • Surface diffraction
Imaging
  • Photoemission EM
  • X-ray microscopy
Photoelectron emission
  • Angular Resolved PES
  • UPS
  • XPS
control/Data analysis
Control Software Type
  • Labview, Java
Data Output Type
  • images, spectra
Data Output Format
  • tiff 16 bit, ascii
Softwares For Data Analysis
  • ImageJ, Igor Pro.