The DAFNE soft x-ray beamline, DXR-1, is mainly dedicated x-ray absorption spectroscopy. The x-ray source is one of the 6-poles planar wiggler devices installed at the DAFNE electron ring for the vertical beam compaction. Due to the wiggler higher magnetic field, with respect to the bending magnet one, the critical energy of the emitted synchrotron radiation spectrum moves from 219 eV (about 57 Å) to about 296 eV (about 42 Å) with a useful flux for x-ray measurements (due to the very high electron current) well beyond ten times the critical energy. The beamline is equipped with a Toyama double-crystal monochromator in ‘boomerang’ geometry, to ensure a fixed beam exit at all achievable energies. Making a selection between the available crystals (Beryl, KTP, InSb, Si and Ge) all light atomic elements from Na to Cl can be studied.

Beamline Energy Resolution
1 [eV] @ 2500 [eV]
Beamline Resolving Power
4 * 10-4 [deltaE/E] @ 2500 [eV]
Beamline Energy Range
900 - 3000 [eV]
Max Flux On Sample
3 * 108 [ph/s] @ 2500 [eV]
Spot Size On Sample Hor
1 - 10 [mm]
Spot Size On Sample Vert
1 - 10 [mm]
Angle Of Incidence Light On Sample Value
40 - 90 [degrees]
Photon Sources

DAFNEL_Wiggler

Type
Wiggler
Source Spectral Flux
5 * 1010 [ph/s/0.1%bw] @ 2500 [eV]
Energy Range
900 - 3000 [eV]
Number Of Periods
3
Monochromators

Double-crystal

Energy Range
900 - 3000 [eV]
Type
Toyama Double-Crystal Monochromator
Resolving Power
1.5 * 103 [deltaE/E] @ 1300 [eV]
Pre-focusing Mirror Type
No
Refocusing Mirror Type
No
Endstations or Setup

EXAFS Chamber

Description
2 Ionization chambers used to measure XAFS spectra in transmission mode and a 4 channel SDD ARDESIA detector for measurements in fluorescence mode. There is also the possibility to use a cryostat for low temperatures measurements.
Base Pressure
1 * 10-5 [mbar]
Detectors Available
Ionization chambers and SDD
Endstation Operative
Yes

Sample

Sample Type
Amorphous, Powder, Liquid, Gas
Mounting Type
Custom sample holders for transmission and fluorescence mode.

Techniques usage

Absorption / EXAFS
EXAFS in transmission and fluorescence mode
Absorption / NEXAFS
NEXAFS in transmission and fluorescence mode
Emission or Reflection / X-ray fluorescence (XRF)
XRF spectra can be measured.

Sample Holders

Type
At RT the sample holder can host up to 10 samples. At 77 K six samples while at 10 K only three.
Description
Sample holders can be under vacuum vertically aligned and if needed also rotated.
Degrees Of Freedom
2
contacts
Antonella BALERNA
Techniques
Absorption
  • EXAFS
  • NEXAFS
Emission or Reflection
  • X-ray fluorescence (XRF)
control/Data analysis
Control Software Type
  • Labview
Data Output Type
  • Spectra
Data Output Format
  • Ascii
Softwares For Data Analysis
  • IXAFS - http://cars9.uchicago.edu/ifeffit/Downloads
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