PETRA III at DESY
P02.1 Powder Diffraction and Total Scattering

The Powder Diffraction and Total scattering, P02.1, is dedicated to study of the atomic scale structure of polycrystalline materials, both in terms of long-range periodic order – by Bragg diffraction – and local structural features, using total scattering and X-ray Pair Distribution Function (PDF) analysis.  We support users from a wide range of fields including chemistry, material science, solid state physics and engineering.

P02.1 is a side station of the P02 beamline, operating simultaneously and independently of the mainline station (P02.2 – Extreme Conditions). Simultaneous operation is achieved by the beamline having a fixed high energy of 60 keV (λ ~ 0.207 A), which makes the beamline well suited for studies of

  • Studies of high-Z containing polycrystalline samples
  • Stress-strain measurements
  • In situ or operando studies of chemical reactions, including crystallisation, catalysis and battery cells
  • Investigation of nanostructured or amorphous materials

The beamline provides an unfocussed beam the size of which may be varied from ~0.2×0.2 mm2 to 1.0×1.0 mm2. A Perkin Elmer XRD1621 area detector mounted on a long translation stage is available for data collection. At the longest sample to detector distances (SDD) of about 2.7 m standard powder (Bragg) diffraction suitable for structure solution and Rietveld refinement may be measured. At the minimum SDD (approx. 0.2 m) total scattering data for PDF analysis may be obtained.

Beamline Energy Resolution
2 * 10-4 [meV] @ 60 [eV]
2 * 10-4 [meV] @ 25.6 [eV]
2 * 10-4 [meV] @ 42.7 [eV]
Beamline Resolving Power
5 * 103 [E/deltaE] @ 60 [eV]
5 * 102 [E/deltaE] @ 42.7 [eV]
5 * 102 [E/deltaE] @ 25.6 [eV]
Beamline Energy Range
25600 - 76600 [eV]
Max Flux On Sample
8 * 1010 [ph/s] @ 42.7 [eV]
4 * 1010 [ph/s] @ 60 [eV]
1 * 1012 [ph/s] @ 25.6 [eV]
Spot Size On Sample Hor
2 - 700 [um]
Spot Size On Sample Vert
2 - 900 [um]
Divergence Hor
0.1 - 1.3 [mrad]
Divergence Vert
0.2 - 0.65 [mrad]
Angle Of Incidence Light On Sample Value
0 - 90 [degrees]
contacts
Martin Etter
Techniques
Diffraction
  • Crystallography
  • Powder diffraction
  • Surface diffraction
  • Time-resolved studies
Emission or Reflection
  • Micro XRF
Scattering
  • Elastic scattering
  • Time-resolved scattering
  • Wide angle scattering
control/Data analysis
Control Software Type
  • Online, Python, Perl
Data Output Type
  • tiff, fio (data arranged in columns)
Data Output Format
  • tiff, ascii, hkl
Softwares For Data Analysis
  • 2d data: inhouse based on Python / integrated / 1d data: common Rietveld programs