HERMES is a phase III beamline dedicated to X-ray microscopy. It combines two types of microscopy. The first one is a Photon-Photon microscopy: Scanning Transmission X-Ray Microscopy (STXM). The second type is Photo-Electron microscopy: X-Ray Photoemitted ElectronMicroscopy (X-PEEM). This original approach offers to users two very complementary techniques, each one being adapted to specific sample environments.  

The STXM essentially enables to probe the sample volume’s properties, with depths of analysis around few hundred nanometers. Besides, X-PEEM  is a surface sensitive technique adapted to an ultra-vacuum environment. It mainly enables to scan the surface’s first few nanometers.
Both techniques carry out X-Ray spectroscopy as a contrast method, in this case a chemical contrast.     
Alongside, other contrast means can be added by making use of the spectroscopic techniques’ specificities. Thus, using circular and linear polarization of light gives an access to magnetic domains, ferromagnetic and antiferromagnetic (XMCD and XMLD)…
Finally, both methods can be used not only to get images of samples, but also to realize some measurement in local spectroscopy (XAS, XANES, XPS, ARPES…) at a nanoscopic scale.

Beamline Resolving Power
5000 [deltaE/E]
Beamline Energy Range
70 - 2500 [eV]
Max Flux On Sample
5.1012 [ph/s]
1.1011 [ph/s]
Photon Sources

Undulator HU42

High energy

Undulator HU64

Low energy
  • Photoemission EM
  • Scanning photoemission EM
  • X-ray microscopy
Photoelectron emission
  • Angular Resolved PES
  • Spin-resolved ARPES
  • XPS
  • Physical Chemistry
Earth Sciences & Environment
  • Mineralogy
Life Sciences & Biotech
  • Protein and macromolecular structures
  • Dynamics
  • Hard condensed matter - electronic properties
  • Hard condensed matter - structures
  • Surfaces, interfaces and thin films
control/Data analysis
Control Software Type
  • -
Data Output Type
  • -
Data Output Format
  • -
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