European Synchrotron Radiation Facility
ID31 High-energy beamline for buried interface structure and materials processing

ID31 is dedicated for interface and materials processing studies using high energy X-rays. It offers a portfolio of hard X-ray characterisation techniques including reflectivity, wide and small angle diffraction (both in transmission and grazing incidence geometry), imaging methods, auxiliary techniques, coupled with a great versatility in choosing beam sizes, energy and energy-band.

Beamline Energy Range
21 - 150 [keV]
Max Flux On Sample
5 * 1015 [ph/s] @ 50 [keV]
Spot Size On Sample Hor
1 - 4000 [um]
Spot Size On Sample Vert
1 - 4000 [um]
Divergence Hor
0 - 30 [urad]
Divergence Vert
0 - 30 [urad]
Angle Of Incidence Light On Sample Value
-3 - 3 [degrees]
Photon Sources

U14

Type
Undulator
Available Polarization
Linear horizontal
Source Divergence Sigma
X = 90 [urad], Y = 3 [urad]
Source Size Sigma
X = 59 [um], Y = 8.3 [um]
Source Spectral Brightness
2 * 1020 [ph/s/mrad^2/mm^2] @ 30000 [eV]
Source Spectral Flux
7 * 1012 [ph/s/0.1%bw] @ 30000 [eV]
Deflection Parameter K
1.5
Energy Range
20 - 150 [keV]
Total Power
12.3 * 103 [W]
Number Of Periods
138
Period
14.5 [mm]
Monochromators

Bent Laue-Laue monochromator

Energy Range
50000 - 150000 [eV]
Type
Horizontally reflection bent Laue crystals in non-dispersive geometry

Multilayer monochromator

Energy Range
20000 - 80000 [eV]
Type
Horizontally reflecting multilayers
Resolving Power
0.36 * 10-2 [deltaE/E]
Number Of Gratings
500
Grating Type
NiV/B4C

Pinhole monochromator

Energy Range
20 - 150 [eV]
Type
Pinhole monochromator
Resolving Power
5 * 10-2 [deltaE/E] @ 30000 [eV]
Other Optics

Monochromatic beam transfocator

Description
Monochromatic beam transfocator 109m from source

White beam transfocator

Description
White beam transfocator 31.5m from source
Endstations or Setup

EH

Microscopes
Imaging optics with PCOedge
Diffractometer
Heavy duty micro-diffraction setup
High resolution diffraction and imaging setup
Detectors Available
Pilatus 2M CdTe
Dexela 2923
Maxipix
Imaging optics with PCOedge
Endstation Operative
Yes

Sample

Sample Type
Crystal, Amorphous, Fiber, Powder, Gel, Liquid, Gas, Other: all
Mounting Type
depends on sample
Detectors

Dexela 2923

Type
Flat panel CMOS detector
Description
CsI screen coupled to CMOS detector
Time Resolved
Yes
Pixel Size
X = 74.8 [um], Y = 74.8 [um]
Array Size
X = 3888 [pixel], Y = 3072 [pixel]
Thickness
0.5 [mm]
Passive or Active (Electronics)
Active
Dynamic Range
65 [dB]

Detection

Detected Particle
Electron

Imaging optics with PCOedge

Type
Imaging detector
Description
Imaging detector with PCOedge
Time Resolved
Yes
Pixel Size
X = 2 [um], Y = 2 [um]
Array Size
X = 2048 [pixel], Y = 2048 [pixel]
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron

Maxipix

Type
Pixel detector
Description
CdTe pixel detector
Pixel Size
X = 55 [um], Y = 55 [um]
Array Size
X = 256 [pixel], Y = 256 [pixel]
Thickness
0.5 [mm]
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron

Pilatus 2M CdTe

Type
large area, single-photon counting detector
Description
high-energy photon-counting detector
Time Resolved
Yes
Pixel Size
X = 172 [um], Y = 172 [um]
Array Size
X = 1475 [pixel], Y = 1679 [pixel]
Thickness
1 [mm]
Passive or Active (Electronics)
Active
Atomic Composition
CdTe

Detection

Detected Particle
Electron
Support Laboratories

Chemistry

Description

Standard laboratory equipment (ultrapure water, heating/stirring plates, balance, glassware, ultrasonic bath) and consumables are available.


Electrochemistry

Description

Electrochemistry laboratory of ID03 is equipped with two fume hoods and can host more than one user group simultaneously. Standard laboratory equipment (ultrapure water, heating/stirring plates, balance, glassware, ultrasonic bath, potentiostat, pH meter, reference electrodes, annealing torch for surface preparation) and consumables are available.


contacts
Veijo Honkimaki
Jakub Drnec
Techniques
Diffraction
  • Crystallography
  • Powder diffraction
  • Surface diffraction
  • Time-resolved studies
Emission or Reflection
  • Reflectrometry
  • Time-resolved studies
Imaging
  • X-ray microscopy
  • X-ray tomography
Scattering
  • Elastic scattering
  • Inelastic scattering
  • Small angle scattering
  • Time-resolved scattering
  • Wide angle scattering
Disciplines
Chemistry
  • Other - Chemistry
Energy
  • Other - Energy
  • Sustainable energy systems
Engineering & Technology
  • Aeronautics
  • Other - Engineering & Technology
  • Space
  • Transport
Material Sciences
  • Knowledge based multifunctional materials
  • Other - Material Sciences
Physics
  • Other - Physics
Address
ID31
control/Data analysis
Control Software Type
  • BLISS
Data Output Type
  • scans, patterns, images, spectra
Data Output Format
  • hdf5, cbf, edf
Equipment That Can Be Brought By The User
Large open floor for user instruments
Other Equipment Available On Site
Cryostats, furnaces, gas loading system, electrochemical cells, fuel cell testing station, etc.
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