European Synchrotron Radiation Facility
BM32 - Surfaces / Interfaces Beamline

French CRG IF beamline for X-ray scattering on Surfaces and Interfaces

 

 

Three instruments are available to offer a complementary and multiscale characterization of surfaces and interfaces in soft and hard condensed matter, suited to technology-related and fundamental science:

 

  • INS : In-situ study of atomic layers growth and nanoscale objects and assembly under ultra high vacuum is allowed in the Surface Ultra Vacuum. (atomic, composition and morphology with hxv (mm)= 0.5x0.2 5 10^11 ph/s monochromatic resolution 1.5 10^-4, 2D detector, surface Diffraction, GIXD, GISAXS)

 

  • GMT: The multitechnic goniometer working in air offers large possibilities to investigate ex/in situ and in operando interfaces between different elements or states of matter.(atomic, composition and morphology with hxv (mm)= 0.5x0.2 5 10^11 ph/s monochromatic resolution 1.5 10^-4, high energy reflectivitty, GIXD, GISAXS, Reci. Space Map)

 

  • Laue Microdiffraction : A station designed for submicronic focussed polychromatic beam (Laue) diffraction: 2D and 3D orientation and strain map of microstructure and microobjet, nanowire. ex/in situ in operando.
Beamline Energy Resolution
3 * 10-4 [eV] @ 19000 [eV]
Beamline Resolving Power
6.5 * 103 [deltaE/E] @ 19000 [eV]
Beamline Energy Range
5000 - 30000 [eV]
Max Flux On Sample
5 * 1011 [ph/s] @ 19 [eV]
Spot Size On Sample Hor
0.3 - 700 [um]
Spot Size On Sample Vert
0.3 - 300 [um]
Divergence Hor
0.2 - 1 [mrad]
Divergence Vert
0.1 - 1 [mrad]
contacts
Jean-Sébastien MICHA
Gilles RENAUD
Maurizio DE SANTIS
Odile ROBACH
Samuel TARDIF
Olivier ULRICH
Techniques
Diffraction
  • Crystallography
  • Surface diffraction
  • Time-resolved studies
  • Topography
Emission or Reflection
  • Micro XRF
  • Reflectrometry
  • X-ray excited optical luminescence (XEOL)
  • X-ray fluorescence (XRF)
Scattering
  • Anomalous scattering
  • Elastic scattering
  • Reflectivity
  • Resonant scattering
  • Small angle scattering
  • Time-resolved scattering
  • Wide angle scattering
Disciplines
Chemistry
  • Physical Chemistry
Earth Sciences & Environment
  • Mineralogy
  • Other - Earth Sciences & Environment
Energy
  • Other - Energy
Engineering & Technology
  • Nanotechnology & production processes
Material Sciences
  • Knowledge based multifunctional materials
  • Metallurgy
  • Other - Material Sciences
  • Technique Development - Material Sciences
Physics
  • Hard condensed matter - structures
  • Nanophysics & physics of confined matter
  • Soft condensed matter physics
  • Surfaces, interfaces and thin films
control/Data analysis
Control Software Type
  • SPEC, mirgration to BLISS scheduled
Data Output Type
  • spectra, images, strain and orientation map
Data Output Format
  • ascii, image (binary, tiff, ...), hdf5
Softwares For Data Analysis
  • ESRF and in house visualisation software, LaueTools package for microdiffraction Laue
Other Equipment Available On Site
INS: standard surface preparation equipments, MBE sources, gas injector, furnace, LEED, Auger
MicroLaue and GMT: furnace, mechanical test machine, sourcemeter,
in partnership with