ID28 is dedicated to the study of phonon dispersion in condensed matter at momentum transfers, Q, and energy transfers, E, characteristic of collective atom motions. Main activities comprise the study of disordered systems and samples only available in very small quantities (<<1 mm^3v) and/or submitted to very high pressures (100 GPa and beyond).

Inelastic X-ray scattering (IXS) is therefore closely related to inelastic neutron scattering (INS) techniques, and consequently largely shares the scientific questions addressed in fields ranging from life science to materials research. IXS is particularly suited for the study of disordered systems such as liquids and glasses in a Q,E-range inaccessible to INS and of samples only available in very small quantities (<< 1 mm3) and/or submitted to very high pressures (up to 100 GPa).

Diffraction side station is available as supplementary instrument for the mapping of reciprocal space.

Beamline Energy Resolution
1.5 [meV] @ 23700 [eV]
3 [meV] @ 17800 [eV]
1.7 [meV] @ 21700 [eV]
Beamline Resolving Power
6 * 106 [deltaE/E] @ 17800 [eV]
1.3 * 107 [deltaE/E] @ 21700 [eV]
1.6 * 107 [deltaE/E] @ 23700 [eV]
Beamline Energy Range
17500 - 23700 [eV]
Max Flux On Sample
2.7 * 1010 [ph/s] @ 17800 [eV]
Spot Size On Sample Hor
25 - 250 [um]
Spot Size On Sample Vert
12 - 100 [um]
Divergence Hor
0.15 - 2 [mrad]
Divergence Vert
0.15 - 4 [mrad]
contacts
Alexei BOSAK
Luigi PAOLASINI
Techniques
Diffraction
  • Crystallography
Scattering
  • Inelastic scattering
Disciplines
Material Sciences
  • Other - Material Sciences
control/Data analysis
Control Software Type
  • SPEC
Data Output Type
  • spectra<br />2D frames
Data Output Format
  • ASCII<br />CBF
Softwares For Data Analysis
  • in-house + modelling via CASTEP and AbInit<br />CrysAlis
in partnership with