ID26 - High-Brilliance X-ray Absorption and Emission Spectroscopy (XAS-XES)

ID26 is dedicated to X-ray spectroscopy in the applied sciences. The high-brilliance X-ray beam allows for absorption studies on very dilute samples. X-ray emission spectroscopy is performed by means of a crystal spectrometer. By combining the tuneable incident energy with an emission spectrometer we take advantage of resonance effects that can provide detailed information on the electronic structure. ID26 is equipped for different sample environments to perform in situ studies and we can also adapt to a variety of user experimental stations.

  • Incident energy range from 2.4 to 27 keV.
  • Quick monochromator scans (’on-the-fly’ date collection) for radiation sensitive samples and time evolution studies.
  • Emission spectrometer using five analyzer crystal with scattering angle between 0 and 180 degrees.
  • Emission spectrometer housed in a vacuum chamber for the tender X-ray range (1.5 - 5 keV).

Scientific Applications

The local coordination and electronic structure of an X-ray absorbing atom are studied by extended X-ray absorption fine structure (EXAFS) and X-ray absorption near edge structure (XANES) spectroscopy. X-ray emission (XES) and resonant inelastic X-ray scattering (RIXS) spectroscopy are sensitive to electron-electron interactions and give information that is complementary to absorption spectroscopy. We can thus study orbital splittings, spin- and oxidation states as well as the local symmetry and coordination. RIXS gives access to element-specific excitations of only a few eV that can arise from local (e.g. d-d), nearest neighbor (e.g. charge transfer).

With the hard X-ray probe, very few restrictions apply to the possible sample environments (cryostat, oven, in-situ cells, liquids). Our main experimental interests are therefore in situ/operandostudies in applied fields. We have ongoing projects in mineralogy/geology, catalysis, materials science, magnetism and cultural heritage.

Beamline Resolving Power
35000 [deltaE/E] @ 7000 [eV]
7000 [deltaE/E] @ 7000 [eV]
Beamline Energy Range
2400 - 27000 [eV]
Max Flux On Sample
5 * 1013 [ph/s] @ 7000 [eV]
Spot Size On Sample Hor
500 [um]
Spot Size On Sample Vert
50 [um]
Divergence Vert
20 [urad]
Photon Sources

u35

Type
Undulator
Number Of Periods
138
Monochromators

Si (111)

Energy Range
2283 - 22685 [eV]
Type
DCM
Resolving Power
7 * 103 [E/deltaE]

Si (311)

Energy Range
4372 - 43438 [eV]
Type
DCM
Resolving Power
35000 [E/deltaE]
Endstations or Setup

In-vacuum x-ray emission spectrometer with 11 Johansson crystals

Base Pressure
1 * 10-5 [mbar]
Detectors

Avalanche photo diode

Thickness
200 [um]
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron

single element SDD

Description
80 mm2 active surface
Thickness
400 [um]
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron
Support Laboratories
contacts
Blanka Detlefs
Pieter Glatzel
Techniques
Absorption
  • EXAFS
  • NEXAFS
  • XMCD
Emission or Reflection
  • X-ray fluorescence (XRF)
Scattering
  • Inelastic scattering
Disciplines
Chemistry
  • Other - Chemistry
Earth Sciences & Environment
  • Other - Earth Sciences & Environment
Energy
  • Sustainable energy systems
Humanities
  • Arts
Life Sciences & Biotech
  • Food quality and safety
  • Molecular and cellular biology
Material Sciences
  • Other - Material Sciences
Address
ID26
European Synchrotron Radiation Facility
71, avenue des Martyrs
CS 40220
38043 Grenoble Cedex 9
control/Data analysis
Control Software Type
  • SPEC
Data Output Type
  • SPEC
Data Output Format
  • ascii
Softwares For Data Analysis
  • inhouse matlab, PyMCA
Equipment That Can Be Brought By The User
Any pending approval by safety group
Other Equipment Available On Site
In-situ cells (see ESRF sample environment)
Cryostat
Possibility To Connect External Endstation
Yes
in partnership with