European Synchrotron Radiation Facility
ID01 - Nano/ Microdiffraction Imaging Beamline

ID01 is an X-ray diffraction and scattering beamline devoted to the study of a wide variety of materials, from nanostructures to bulk, with the ability to perform imaging and strain studies using coherent X-ray diffraction methods and/or nanodiffraction. An article describing the beamline in detail for the user community can be found here.

Beamline Energy Resolution
1 [eV] @ 8000 [eV]
Beamline Resolving Power
1 * 10-40 [deltaE/E] @ 10000 [eV]
Beamline Energy Range
6 - 30 [keV]
Max Flux On Sample
10 * 1012 [ph/s] @ 8 [eV]
Spot Size On Sample Hor
0.035 - 1000 [um]
Spot Size On Sample Vert
0.035 - 1000 [um]
Divergence Hor
30 - 1000 [urad]
Divergence Vert
6 - 1000 [urad]
Transverse Coherence Length At Sample Position Vert Value
0.05 - 400 [um]
Transverse Coherence Length At Sample Position Hor Value
0.05 - 150 [um]
Angle Of Incidence Light On Sample Value
0 - 120 [degrees]
Monochromators

0.3 % Bandpass multilayer

Energy Range
8 - 40 [eV]
Type
Ni/B4C Multilayer; 2.0 and 2.5 nm periodicity. 8.3-15 KeV not considered ideal (Ni-K-edge)
Resolving Power
3 * 10-3 [deltaE/E] @ 8 [eV]
Number Of Gratings
400

Si(111)

Type
Si 111 horizontally deflecting Monochromator
Resolving Power
1.5 * 10-4 [deltaE/E] @ 8 [eV]
Other Optics

CRLs

Description
Be Compound refractive lenses produce beam sizes from 300nm up to a micron

KB mirror

Description
6-11 keV and 19.5-20.5keV, bemasize approx. 200x300 nm

Nanofocusing Fresnel zone plates

Description
Energy range: 6-11 keV, beamsizes down to 35 nm
Endstations or Setup

Full field diffraction imaging endstation

Microscopes
Full field diffraction microscope, 200 nm resolution

Sample

Sample Type
Crystal, Amorphous, Fiber, Powder, Other:

Manipulator or Sample stage

Description
Grazing incidence goniometer
Two smaract SLC-1730 X-Y linear positioners (±10mm)
SGO-60.5 + SGO-77.5 cradle goniometers (±5°)
SR-7012 rotary positioner (infinite rotation)
Xray-technique: Grazing incidence experiments (GISAXS); Full Field Diffraction (FFDXM)
Short working distance: 2mm between sample & focusing/imaging lenses.
Description
Nano-goniometer
Precisely manipulating 2D samples in transmission geometry
Xray-technique : transmission
Additional translation axis option enables its use as a miniature goniometer for the sample itself

Sample Environment

Description
AFM, indenters, strain rigs
The AFM tip can also be used to deform materials to study mechanical behaviour in-situ. (Nano-Indenter)
Xray-technique : simultaneous measurements of topography (AFM) and crystallinity (XRD)
Description
Battery cell
3 electrodes, half battery cell
FFDXM experiments, the battery cell operates in Bragg geometry
The battery cell can also operate in transmission geometry (SAXS or high energy WAXS)
Description
Catalysis furnace
Watercooled furnace
Max operating temperature > 1000°C (with Be done)
Max operating temperature 400°C (with Polymer dome)
Stability : ±0.10°C @ 100°C ±0.15°C @ 200°C
It can host sample sizes up to 10 × 10 mm2
Temperature
300 - 1300 [K]
Description
Continuous flow mini-cryostat
Temperature > 2K
Vacuum : 10^-6 mbar
Xray-technique : operated in horizontal scattering geometry. The piezo scanning stage is placed under the focusing optic to enable use of the K-map method
Pressure (min)
1 * 10-6 [mbar]
Temperature
2 - 300 [K]
Description
Electrochemical cell
Electrolyte layers below 100 µm
Cell allows control of liquid phase composition and electrochemical potential via a three electrode configuration (working, reference, and counter electrodes)
Description
Furnace
Max operating temperature > 1200°C (with Be done)
Max operating temperature 400°C (with Polymer dome)
Stability : ±0.10°C @ 100°C; ±0.15°C @ 200°C
Max Sample Size: 10 × 10 mm2
x-ray technique: reflection / diffraction
A gas-rig with mass flow controllers can be connected
Temperature
300 - 1470 [K]
Description
Gas flow setup :
Rough vacuum / inert gases
Sample maximum size 25x25mm
Xra-technique : reflection / diffraction
Description
Vacuum furnace
Max operating temperature > 1200°C (with Be done)
Max operating temperature 400°C (with Polymer dome)
Stability: ±0.10°C @ 100°C ±0.15°C @ 200°C
Temperature
300 - 1470 [K]

Sample Holders

Type
magnetic mounts (ThorLabs)
Description
Kinematic mounts
Reproducible sample positioning , few microns, 50 µrad
Dimension of the magnetic mount : 25x25mm
Samples are usually glued onto the upper part fo the magnetic mount.
Xray-technique : Xray diffraction

Nanodiffraction endstation

Description
PImars piezo (100x100x20 micron stroke), sat on BORA symmetrie hexapod (10,10,5 mm stroke) + 3 rotations
Microscopes
light microscope (10x,20x,50x objective)
Diffractometer
Huber 3S+2D
Detectors Available
Maxipix 516x516 (Si absorber)
PSI Eiger 2M 2164x1030 (Si absorber)

Sample

Sample Type
Crystal, Amorphous, Powder
Required Sample Size
X = 0.003 [um], Y = 0.003 [um], Z = 0.003 [um]

Techniques usage

Imaging / Coherent diffractive imaging
Bragg CDI
Imaging / Ptychography
Transmission Ptychography for beam profile calibration
Bragg Ptychography
Imaging / X-ray microscopy
Scanning X-ray Diffraction Microscopy
Full field X-ray diffraction microscopy
Scattering / Elastic scattering
Grazing incidence small angle X-ray scattering
Small angle X-ray scattering
Detectors

Andor Zyla 2560,2160

Detection

Detected Particle
Electron

Maxipix 516x516 (Si absorber)

Type
pixel detector, photon counting based on Medipix 2
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron

PSI Eiger 2M 2164x1030 (Si absorber)

Detection

Detected Particle
Electron
contacts
Tobias SCHULLI
Steven LEAKE
Peter BOESECKE
Techniques
Diffraction
  • Crystallography
  • Surface diffraction
Imaging
  • Coherent diffractive imaging
  • Ptychography
  • X-ray microscopy
Scattering
  • Coherent scattering
  • Elastic scattering
  • Wide angle scattering
Disciplines
Chemistry
  • Catalysis
  • Electrochemistry
Earth Sciences & Environment
  • Geology
Energy
  • Sustainable energy systems
Engineering & Technology
  • Nanotechnology & production processes
Material Sciences
  • Knowledge based multifunctional materials
  • Metallurgy
  • Other - Material Sciences
Physics
  • Hard condensed matter - structures
  • Nanophysics & physics of confined matter
  • Surfaces, interfaces and thin films
Address
http://www.esrf.eu/UsersAndScience/Experiments/XNP/ID01
control/Data analysis
Control Software Type
  • spec
Data Output Type
  • spec scans recording motors, counters, etc.; pixel detector images
Data Output Format
  • ascii (spec) edf and zipped edf, hdf5
Softwares For Data Analysis
  • PyNX (http://ftp.esrf.fr/pub/scisoft/PyNX/doc/) XSOCS (https://gitlab.esrf.fr/kmap/xsocs) BCDI pre/post processing (https://github.com/carnisj/bcdi) Miscellaneous beamline tools (https://gitlab.esrf.fr/opid01/id01sware)
Equipment That Can Be Brought By The User
anything below 1 Kg in weight. Please check with the BL Personnel for spatial constraints
in partnership with