ANTARES is a soft X-ray source dedicated to high resolution Angle Resolved Photoelectron Spectroscopy (ARPES) with very high lateral resolution. This setup offers a spectroscopic non-destructive nano-probe named k-space nanoscope to deeply study the electronic structure of advanced materials using angle resolved photoemission spectroscopy with nano-scale lateral resolution (nanoARPES). The innovative scanning photoemission microscopy combines linear and angle sweeps of the samples to perform precise electronic band k-dispersion determinations using nano–ARPES technique. This spectro-microscope is fully compatible with a high resolution R4000 Scienta hemispherical analyser, ensuring the high energy and k space resolution to settle even tiny features in complex electronic band structures. The beamline was designed to cover a large energy photon range from 10 eV to 900 eV, which allows carrying our surface and bulking studies in diverse condensed matter fields. In particular, a complete chemical imaging of the samples can be obtained by detecting the core levels and their chemical shifts with lateral nano-scale resolution. The beamline uses two undulators as a source with high flux and adjustable circular and linear polarisation. The energy is selected by a high-resolution PGM monochromator presenting best efficiency and purity of the monochromatic light. The micro- and nano-ARPES measurements can be alternatively conducted with a spot light size of ≈ 120 mm and ≈ 30, respectively.

Beamline Energy Resolution
3 * 1010 [eV] @ 60 [eV]
Beamline Resolving Power
30000 [deltaE/E] @ 60 [eV]
Beamline Energy Range
20 - 900 [eV]
Max Flux On Sample
5 * 1010 [ph/s] @ 100 [eV]
5.4 * 1010 [ph/s] @ 100 [eV]
Spot Size On Sample Hor
0.1 - 90 [um]
Spot Size On Sample Vert
0.1 - 90 [um]
Emission or Reflection
  • Micro XRF
  • X-ray fluorescence (XRF)
  • Fluorescence imaging
  • Medical application
  • Photoemission EM
  • Scanning photoemission EM
  • X-ray microscopy
Photoelectron emission
  • Angular Resolved PES
  • Photoelectron diffraction
  • UPS
  • XPS
Material Sciences
  • Other - Material Sciences
  • Hard condensed matter - electronic properties
  • Surfaces, interfaces and thin films
control/Data analysis
Control Software Type
Data Output Type
  • IGOR and NEXUS
Data Output Format
  • IGOR and NEXUS
Softwares For Data Analysis
  • IGOR and LINUS
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