Surface and Interface Spectroscopy

The Surface and Interface Spectroscopy beamline (SIS) provides a state-of-the-art experimental set-up to study the electronic and atomic structure of surfaces. The beamline has been designed for high photon energy resolution with low harmonic contamination and flexible light polarization. The high-resolution photoemission spectroscopy (HR-PES)endstation is designed for angle-resolved photoelectron spectroscopy (ARPES) and photoelectron diffraction (PED). A second endstation, COPHEE (COmplete PHotoEmission Experiment), offers spin-resolved ARPES using a double-Mott detector scheme, which enables 3D spin polarimetry. The two endstations are switchable via a rotating platform.

Beamline Energy Resolution
2 * 10-3 [eV] @ 20 [eV]
Beamline Resolving Power
10 [deltaE/E] @ 200 [eV]
Beamline Energy Range
10 - 800 [eV]
Max Flux On Sample
2 * 1013 [ph/s] @ 200 [eV]
Nicholas Plumb
Ming Shi
Photoelectron emission
  • Angular Resolved PES
  • Photoelectron diffraction
  • Spin-resolved ARPES
  • UPS
  • XPS
control/Data analysis
Control Software Type
  • HR-PES: In-house developed acquisition program "SIStem", or "Ses" by VG Scienta; COPHEE: In-house developed "Croissant"
Data Output Type
  • tbd
Data Output Format
  • SIStem: .h5 (HDF5); Ses: .pxt (Igor Pro), .ibw (Igor Pro), .txt (ASCII); Croissant: ASCII
Softwares For Data Analysis
  • Igor Pro-based data loading/viewing/analysis software at beamline. Routines available to users upon request.
in partnership with