Surface / Interface Spectroscopy

The Surface/Interface Spectroscopy (SIS) beamline provides a state-of-the-art experimental set-up to study the electronic band structure of novel complex materials by spin- and angle-resolved photoemission spectroscopies. The beamline operates in the energy range from 10 to 800 eV with high flux, high resolution, variable polarization, and low high-harmonic contamination.

The beamline serves two endstations:

  • ULTRA (Ultra Low-Temperature high-Resolution ARPES)
    for angle-resolved photoelectron spectroscopy (ARPES)
  • COPHEE (Complete PHotoEmission Experiment)
    for spin- and angle-resolved photoelectron spectroscopy (SARPES)
Beamline Energy Resolution
2 * 10-3 [eV] @ 20 [eV]
Beamline Resolving Power
10 [deltaE/E] @ 200 [eV]
Beamline Energy Range
10 - 800 [eV]
Max Flux On Sample
2 * 1013 [ph/s] @ 200 [eV]
Photon Sources

UE212

Type
Undulator
Available Polarization
Linear horizontal, Linear vertical, Circular
Energy Range
8 - 800 [eV]
Note
Electromagnetic undulator. Available quasiperiodic linear horizontal mode for harmonic rejection at low energies. Energy range is polarization-dependent: LH = 8-800 eV, LHQ = 8-200 eV, LV = 40-800 eV, C+/- = 20-800 eV.
Monochromators

NIM

Energy Range
10 - 30 [eV]
Type
Normal incidence monochromator. Non standard operation! Contact beamline scientist if interested.
Grating Type
Plane grating

PGM 1

Energy Range
20 - 350 [eV]
Type
Plane grating monochromator
Resolving Power
1 * 104 [E/deltaE] @ 200 [eV]
Grating Type
Plane grating, 300 lines/mm

PGM 2

Energy Range
80 - 800 [eV]
Type
Plane grating monochromator
Grating Type
Plane grating, 1200 lines/mm
Endstations or Setup

COPHEE

Description
Spin- and angle-resolved photoemission spectroscopy (SARPES)
Diffractometer
Low-energy electron diffraction (LEED)
Spectrometer
Omicron EA125 with two orthogonally-mounted classical Mott detectors for 3D spin polarization analysis
Base Pressure
5 * 10-11 [mbar]
Detectors Available
3D Mott polarimeter
Endstation Operative
Yes

Sample

Sample Type
Crystal, Amorphous
Mounting Type
Samples can be fixed using UHV-compatible epoxy or by clamping. Top-post cleaving is possible.

Manipulator or Sample stage

Description
Base temperature ~20 K
Degrees Of Freedom
6
Translator Stages
3
Cradles
3
Positioning Precision
X = 10 [um], Y = 10 [um], Z = 10 [um]

Sample Environment

Pressure (min)
5 * 10-11 [mbar]

Sample Holders

Description
Cylindrical "puck"- or "mushroom"-style holder used on CARVING manipulators. Contact the beamline scientists for drawings.

ULTRA

Description
Low-temperature, high-resolution angle-resolved photoemission spectroscopy (ARPES)
Diffractometer
Low-energy electron diffraction with multichannel plate detector (MCP-LEED)
Spectrometer
Scienta Omicron DA30-L
Base Pressure
5 * 10-11 [mbar]
Detectors Available
CCD camera
Endstation Operative
Yes

Sample

Sample Type
Crystal, Amorphous
Mounting Type
Samples can be fixed using UHV-compatible epoxy or by clamping. Top-post cleaving is possible.

Manipulator or Sample stage

Description
Base temperature ~4.2 K in continuous flow mode, ~3.8 K in "single-shot" mode. DoF (x, y, z, theta, phi, tilt) are fully decoupled.
Degrees Of Freedom
6
Translator Stages
3
Cradles
3
Positioning Precision
X = 10 [um], Y = 10 [um], Z = 10 [um]

Sample Environment

Description
Double mu-metal shielded chamber with internal cryoshield/cryopump.
Pressure (min)
2 * 10-11 [mbar]

Sample Holders

Description
Sample mounting based on "Omicron-style" plates. Ideal sample height is 0.7 mm above standard plate height, so a raised platform (countersunk hole) may be desired for thin (thick) samples. Overall height restriction due to radiation flip-shield. Plates cannot have bottom-protruding parts. Samples may be glued with UHV-compatible epoxy, or fixed by clamps or other means. Users are strongly encouraged to contact the beamline scientists to discuss sample plates/mounting.
Detectors

3D Mott polarimeter

Type
3D Mott polarimeter comprised of two orthogonally-mounted classical Mott detectors
Output Readout Software
"Croissant" data acquisition software

Detection

Detected Particle
Electron

CCD camera

Type
Basler Scout scA1400-17gm
Description
MCP-screen-CCD detector
Pixel Size
X = 6.45 [um], Y = 6.45 [um]
Array Size
X = 1392 [pixel], Y = 1040 [pixel]
Dynamic Range
67.7 [dB]
Signal/NoiseRatio
42.7 [dB]
Output Readout Software
SIStem (custom beamline scanning software), SES (standard Scienta Omicron software)

Detection

Detected Particle
Electron
contacts
Nicholas Plumb
Ming Shi
Techniques
Photoelectron emission
  • Angular Resolved PES
  • Photoelectron diffraction
  • Spin-resolved ARPES
  • UPS
  • XPS
Disciplines
Material Sciences
  • Knowledge based multifunctional materials
  • Other - Material Sciences
Physics
  • Hard condensed matter - electronic properties
  • Matter under extreme conditions, warm dense matter, plasmas
  • Other - Physics
  • Quantum electronics & optics
  • Surfaces, interfaces and thin films
control/Data analysis
Control Software Type
  • ULTRA: In-house developed acquisition program "SIStem", or "Ses" by VG Scienta; COPHEE: In-house developed "Croissant"
Data Output Type
  • tbd
Data Output Format
  • SIStem: .h5 (HDF5); Ses: .pxt (Igor Pro), .ibw (Igor Pro), .txt (ASCII); Croissant: ASCII
Softwares For Data Analysis
  • Igor Pro-based data loading/viewing/analysis software at beamline. Routines available to users upon request.
Possibility To Connect External Endstation
Yes
in partnership with