Scanning Transmission X-Ray Microspectroscopy

The PolLux soft X-ray STXM beamline allows the quantitative nanoscale mapping of chemical and physical properties such as elemental distribution, magnetisation, oxidation states, organic species (molecular structure) and molecular order and orientation. Such analyses serve materials science in a wide range of applications and scientific disciplines. Prominent research at PolLux includes:

  • the study of magnetism in nanostructures, which could ultimately lead to new magnetic storage systems,
  • the study of nanostructures in conjugated polymers for improved optoelectronic devices such as organic solar cells and light emitting diodes, and
  • studies of chemical and physical effects in organic micro- and nanoparticles for improved understanding of environmental processes.
Beamline Resolving Power
3000 [deltaE/E]
Beamline Energy Range
270 - 1600 [eV]
Max Flux On Sample
1 * 107 [ph/s] @ 1000 [eV]
Spot Size On Sample Hor
20 - 30 [nm]
Spot Size On Sample Vert
20 - 30 [nm]
contacts
Joerg Raabe
Benjamin Watts
Techniques
Absorption
  • NEXAFS
  • Time-resolved studies
  • XMCD
Imaging
  • X-ray microscopy
Disciplines
Chemistry
  • Other - Chemistry
Energy
  • Other - Energy
Life Sciences & Biotech
  • Medicine
  • Molecular and cellular biology
Material Sciences
  • Knowledge based multifunctional materials
  • Other - Material Sciences
Physics
  • Other - Physics
control/Data analysis
Control Software Type
  • Graphical user interface with python scripting functionality
Data Output Type
  • hyperspectral images and spectra
Data Output Format
  • NeXus based HDF5 (NXstxm): https://aip.scitation.org/doi/abs/10.1063/1.4937536
Softwares For Data Analysis
  • aXis2000: http://unicorn.mcmaster.ca/aXis2000.html<br />MANTiS: http://spectromicroscopy.com/
in partnership with